July 2024

Conference Paper

From Imaging Conductivity to Imaging Electron Density

By:
Dyck, Ondrej E; Ulmatlaq, Jawaher; Lingerfelt, David; Swett, Jacob; Huang, Bevin; Lupini, Andrew R; Englund, Dirk; Jesse, Stephen
Journal Name:
Microscopy and Microanalysis
Page Number:
ozae044.06
Volume:
30
Publication Date:
July 2024
Conference Name:
Microscopy and Microanalysis
Conference Location:
Cleveland, Ohio, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1093/mam/ozae044.065