November 2017

Conference Paper

Failures in Large Scale Systems: Long-term Measurement, Analysis, and Implications

By:
Gupta, Saurabh; Patel, Tirthak; Engelmann, Christian ; Tiwari, Devesh
Page Number:
44:1-44:12
Book Title:
Proceedings of the 30th IEEE/ACM International Conference for High Performance Computing, Networking, Storage and Analysis (SC'17) 2017
Publication Date:
November 2017
Conference Name:
30th IEEE/ACM International Conference on High Performance Computing, Networking, Storage and Analysis (SC) 2017
Conference Location:
Denver, Colorado, United States of America
Conference Sponsor:
IEEE/ACM
View DOI Listing:
https://doi.org/10.1145/3126908.3126937

Abstract

Resilience is one of the key challenges in maintaining high efficiency of future extreme scale supercomputers. Researchers and system practitioners rely on field-data studies to understand reliability characteristics and plan for future HPC systems. In this work, we compare and contrast the reliability characteristics of multiple large-scale HPC production systems. Our study covers more than one billion compute node hours across five different systems over a period of 8 years. We confirm previous findings which continue to be valid, discover new findings, and discuss their implications.

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