August 2008

Conference Paper

Fabricating Atom Probe Tomography Specimens from TEM foils

By:
Miller, Michael K; Russell, Kaye ; Hoelzer, David T
Journal Name:
Microscopy and Microanalysis
Page Number:
1022CD
Volume:
14
Issue Number:
2
Publication Date:
August 2008
Conference Name:
Microscopy and Microanalysis 2008
Conference Location:
Albuquerque, New Mexico, United States of America
Conference Sponsor:
Microscopy Society of America

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