January 2011

Journal

Exploring Topological Defects in Epitaxial BiFeO3 Thin Films

By:
Vasudevan, Rama K; Chen, Yi-Chun; Tai, Hsiang-Hua; Wisinger, Nina ; Wu, P; Bhattacharya, Saswata; Chen, L. Q.; Chu, Ying-Hao; Lin, I-Nan; Kalinin, Sergei V; Nagarajan, Valanoor
Journal Name:
ACS Nano
Page Number:
879-887
Volume:
5
Issue Number:
2
Publication Date:
January 2011
View DOI Listing:
https://doi.org/10.1021/nn102099z

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