August 2010

Journal

Examination of Through-Thickness/Through-Time Phase Evolution during an MOD-Type REBCO Precursor Conversion Using Raman Microsscopy

By:
Chen, Z; Maroni, Victor; Miller, D.; Li, Xiaoping; Rupich, Marty; Feenstra, Roeland
Journal Name:
Superconductor Science & Technology
Page Number:
85006
Volume:
23
Issue Number:
8
Publication Date:
August 2010
View DOI Listing:
https://doi.org/10.1088/0953-2048/23/8/085006