July 2025

Conference Paper

Elucidating Processes at Hard-Soft Interfaces in Next-Generation Electrochemical Devices by Cryogenic Electron Microscopy

By:
Zachman, Michael J; Oh, Juhyun ; Cullen, David A; Sahore, Ritu ; Chen, Xi ; Wang, Xiaoping; Myers, Deborah; Ushizima, Daniela; Kwon, Obeen; Zenyuk, Iryna
Journal Name:
Microscopy and Microanalysis
Page Number:
1262
Volume:
31
Issue Number:
Supplement
Publication Date:
July 2025
Conference Name:
Microscopy and Microanalysis
Conference Location:
Salt Lake City, Utah, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1093/mam/ozaf048.654