February 2006

Journal

Electron-Hole Excitations in NiO: LSDA + U-Based Calculations vs. Inelastic X-Ray Scattering and Ellipsometry Measurements

By:
Eguiluz, Adolfo G; Restrepo, O.; Larson, Bennett C; Tischler, Jonathan Z; Zschack, P.; Jellison Jr, Gerald E
Journal Name:
Journal of Physics and Chemistry of Solids
Page Number:
2281-2289
Volume:
66
Issue Number:
12
Publication Date:
February 2006