July 2010

Journal

Critical Test of Simulations of Charge-Exchange-Induced X-Ray Emission in the Solar System

By:
Ali, R.; Neill, P.; Beiersdorfer, P.; Harris, C.; Schultz, David R; Stancil, Phillip
Journal Name:
Astrophysical Journal. Letters to the Editor
Page Number:
L95-L98
Volume:
716
Issue Number:
2
Publication Date:
July 2010
View DOI Listing:
https://doi.org/10.1088/2041-8205/716/2/L95