July 2016

Conference Paper

Considerations and Challenges with Characterizing Si/SiGe Interfaces

By:
Dyck, Ondrej E; Leonard, Donovan N; Poplawsky, Jonathan D; Kiselev, Andrey; Jackson, Clayton; Edge, Lisa
Publication Date:
July 2016
Conference Name:
Microscopy and Microanalysis 2016 Meeting
Conference Location:
Columbus, Indiana, United States of America

Related Researchers