August 2006

Conference Paper

Composition of 4H-SiC/SiO2 Interfaces by Electron Energy-Loss Spectroscopy

By:
Bentley, James ; Chang, K.-C.; Cao, Y.; Porter, L.M.
Journal Name:
Microscopy and Microanalysis
Page Number:
1142-1143
Volume:
12
Issue Number:
suppl 2
Publication Date:
August 2006
Conference Name:
Microscopy and Microanalysis
Conference Location:
Chicago, Illinois, United States of America
Conference Sponsor:
MSA, MAS, IMS, MSC/SMC