April 2018

Conference Paper

Characterization of the Impact of Soft Errors on Iterative Methods

By:
Ozcelik Mutlu, Burcu; Kestor Gioiosa, Gokcen ; Joseph Manzano, Joseph; Unsal, Osman; Chatterjee, Samrat; Krishnamoorthy, Sriram
Journal Name:
Silicon Errors in Logic – System Effects
Page Number:
1-6
Issue Number:
1
Book Title:
Silicon Errors in Logic – System Effects
Publication Date:
April 2018
Conference Name:
Silicon Errors in Logic – System Effects (SELSE 2018)
Conference Location:
Boston, Massachusetts, United States of America
Conference Sponsor:
IEEE