August 2011

Conference Paper

Bringing Standardized Processes in Atom-Probe Tomography: I – Establishing Standardized Terminology

By:
Anderson, Ian; Danoix, F; Forbes, Richard; Gault, Baptiste; Kelly, T. F.; Marquis, E; Miller, Michael K; Moody, M.; Vurpillot, F
Journal Name:
Microscopy and Microanalysis
Page Number:
858
Volume:
17
Issue Number:
N/A
Publication Date:
August 2011
Conference Name:
Microscopy and Microanalysis 2011
Conference Location:
Nashville, Tennessee, United States of America