September 2016

Journal

Big, deep, and smart data in scanning probe microscopy

By:
Kalinin, Sergei V; Strelcov, Evgheni ; Belianinov, Alex A; Somnath, Suhas ; Vasudevan, Rama K; Lingerfelt, Eric J; Archibald, Richard K; Chen, Chaomei; Proksch, Roger; Laanait, Nouamane ; Jesse, Stephen
Journal Name:
ACS Nano
Page Number:
9068-9086
Volume:
10
Issue Number:
10
Publication Date:
September 2016
View DOI Listing:
https://doi.org/10.1021/acsnano.6b04212

Abstract

Scanning probe microscopy techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of structure and functionality of matter on nanometer and atomic scales. Here, we analyze the discovery process by SPM in terms of information flow from tip-surface junction to the knowledge adoption by scientific community. We further discuss the challenges and opportunities offered by merging of SPM and advanced data mining, visual analytics, and knowledge discovery technologies.