May 2007

Conference Paper

Automated Test Stand for HEV Capacitor Testing

By:
Seiber, Larry E; Armstrong, Gary
Page Number:
63-68
Issue Number:
N/A
Book Title:
Proceedings 2007 IEEE SoutheastCon
Publication Date:
May 2007
Publisher Location:
IEEE, New Jersey, United States of America
Conference Name:
IEEE SoutheastCon 2007
Conference Location:
Richmond, Virginia, United States of America
Conference Sponsor:
IEEE

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