July 2021

Conference Paper

Atomic-scale Feedback-controlled Electron Beam Fabrication of 2D Materials

By:
Boebinger, Matthew G; Misra, Sudhajit ; Yu, Yiling ; Xiao, Kai ; Mathis, Tyler; Gogotsi, Yury; Lupini, Andrew R; Kalinin, Sergei V; Jesse, Stephen ; Unocic, Raymond R
Journal Name:
Microscopy and Microanalysis
Page Number:
3072-3073
Volume:
27
Issue Number:
S1
Publication Date:
July 2021
Conference Name:
2021 Microscopy and Microanalysis Annual Meeting
Conference Location:
Pittsburgh, Pennsylvania, United States of America
Conference Sponsor:
Microscopy Society of America and Microanalysis Society
View DOI Listing:
https://doi.org/10.1017/S1431927621010631