September 2014

Journal

Atomic-Scale Characterization of Oxide Thin Films Gated by Ionic Liquid

By:
Lang, Andrew; Sloppy, Jennifer; Ghassemi, H.; Devlin, Robert; Sichel-Tissot, Rebecca; Idrobo Tapia, Juan C; May, Steven; Taheri, M
Journal Name:
ACS Applied Materials & Interfaces
Page Number:
17018-17023
Volume:
6
Issue Number:
19
Publication Date:
September 2014