February 2015

Conference Paper

Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

By:
Parish, Chad M; Kondo, Sosuke ; Koyanagi, Takaaki ; Kato, Yutai
Publication Date:
February 2015
Conference Name:
Microscopy and Microanalysis
Conference Location:
Hartford, Connecticut, United States of America