August 2018

Conference Paper

Atomic-resolution electric field measurements with a universal detector

By:
Hachtel, Jordan A; Thind, Arashdeep; Mishra, Rohan; Idrobo Tapia, Juan C; Chi, Miaofang
Journal Name:
Microscopy and Microanalysis
Page Number:
114-115
Volume:
24
Issue Number:
S1
Publication Date:
August 2018
Conference Name:
Microscopy & Microanalysis 2018
Conference Location:
Baltimore, Maryland, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1017/S143192761800106X