August 2010

Conference Paper

Atom Probe Tomography as a Tool for Characterizing Irradiated Materials

By:
Miller, Michael K; Russell, Kaye ; Hoelzer, David T; Kovarik, L.; Mills, Michael; Certain, Alicia; Allen, Todd
Journal Name:
Microscopy and Microanalysis
Page Number:
1602-1603
Volume:
16
Issue Number:
2
Publication Date:
August 2010
Conference Name:
Microsccopy and Microanalysis 2010
Conference Location:
Portland, Oregon, United States of America

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