Application of Direct Current Potential Drop for the J-integral vs. Crack Growth Resistance Curve Characterization
By:
Chen, Xiang ; Nanstad, Randy K; Sokolov, Mikhail A
Page Number:
97-112
Volume:
N/A
Book Title:
ASTM STP 1584
Publication Date:
July 2015
Publisher Location:
ASTM International, West Conshohocken, Pennsylvania, United States of America
Conference Name:
Fourth Symposium on the Evaluation of Existing and New Sensor Technologies for Fatigue, Fracture and Mechanical Testing
Conference Location:
Toronto, Canada
Conference Sponsor:
ASTM
Abstract
The direct current potential drop (DCPD) technique has been applied to derive the J-integral vs. crack growth resistance curve (J-R curve) for fracture toughness characterization of structural materials. The test matrix covered three materials including type 316LN stainless steels, Ni-based alloy 617, and one ferritic-martensitic steel, three specimen configurations including standard compact, single edge bending, and disk-shaped compact specimens, and temperatures ranging from 20°C to 650°C. When compared with baseline J-R curves derived from the ASTM normalization method, the original J-R curves from the DCPD technique yielded much smaller Jq values due to the influence of crack blunting, plastic deformation, etc. on potential drop. To counter these effects, a new procedure for adjusting DCPD J-R curves was proposed. After applying the new adjustment procedure, the average difference in Jq between the DCPD technique and the normalization method was only 5.2% and the difference in tearing modulus was 7.4%. The promising result demonstrates the applicability of the DCPD technique for the J-R curve characterization especially in extreme environments, such as elevated temperatures, where the conventional elastic unloading compliance method faces considerable challenges.