Aberration-Corrected STEM Imaging Through Off-Site Remote Operation

Abstract

Recent advances in aberration-corrected electron microscopy have allowed researchers to image materials at sub-Ångström resolution. Many of these modern instruments are designed to be operated from separate 'control' rooms, removing the effect of the operator on the instrument’s physical environment. This capability also allows operation from suitable workstations, over internet connections, from literally anywhere in the world [1]. Researchers at the University of Texas at Austin (UTA) have collaborated with Oak Ridge National Laboratory (ORNL) and JEOL Ltd. to routinely conduct research sessions in which high-resolution images and X-ray microanalytical data are acquired during after-hours research sessions, utilizing the JEOL 2200FS aberration-corrected STEM/TEM at ORNL from their lab in Austin. Details of the remote operation are presented here.