July 2016

Journal

Ab initio study of point defects near stacking faults in 3C-SiC

By:
Xi, Jianqi; Liu, Bin; Zhang, Yanwen ; Weber, William J
Journal Name:
Computational Materials Science
Page Number:
131-138
Volume:
123
Issue Number:
N/A
Publication Date:
July 2016
View DOI Listing:
https://doi.org/10.1016/j.commatsci.2016.06.023