September 2015

Conference Paper

A Novel Backside Gate Structure to Improve Device Performance

By:
Hwang, Ya-Hsi; Zhu, W.; Dong, C.; Ahn, S.; Ren, F.; Kravchenko, Ivan I; Smith, David; Pearton, S.
Journal Name:
ECS Transactions
Page Number:
185-190
Volume:
66
Issue Number:
1
Publication Date:
September 2015
Conference Name:
227th ECS Meeting
Conference Location:
Chicago, Illinois, United States of America
View DOI Listing:
https://doi.org/10.1149/06601.0185ecst

Related Researchers