March 2026

Conference Paper

A Graph-Net with Node Embeddings to Detect False Data Injection Attacks in Photovoltaic Systems

By:
Parvez, Imtiaz; Sundararajan, Aditya
Page Number:
85-90
Book Title:
IEEE International Conference on Electro Information Technology (eIT)
Publication Date:
March 12, 2026
Publisher Location:
IEEE, New Jersey, United States of America
Conference Name:
2025 IEEE International Conference on Electro Information Technology (eIT)
Conference Location:
Valparaiso, Indiana, United States of America
Conference Sponsor:
IEEE
View DOI Listing:
https://doi.org/10.1109/eIT64391.2025.11103667

Abstract

Distributed energy resources (DER) contribute to the operational stability of the larger power grid both at utility-scale as well as commercial and residential scales in aggregated forms. These DER in-turn are susceptible to increasing cyber threats. An adversary can plug into the same local network that a field photovoltaic (PV) system uses to interconnect its data loggers and inverters and manipulate certain measurements collected from the network or trick existing irradiance and inverter readings through false data injection attacks (FDIA). Control routines that rely on these measurements can propagate the false data, impacting critical decisions that result in a suboptimal operation or even cause intentional harm leading to inverter-tripping or unscheduled loads that need to be shed. To detect FDIA in PV systems, the paper introduces an attention-based graph neural network with node embeddings and applied it to a simple prototypical DC-coupled microgrid with PV, energy storage, and load. The algorithm shows a detection accuracy of up to 98.95%. The proposed FDIA detection technique will provide micro-grid operators with an effective method to safeguard their systems, guaranteeing the secure and reliable operation.


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