September 2012

Journal

A 200 C Universal Gate Driver Integrated Circuit for Extreme Environment Applications

By:
Tolbert, Leon M; Huque, Mohammad A; Islam, Syed K; Blalock, Benjamin J
Journal Name:
IEEE Transactions on Power Electronics
Page Number:
4153-4162
Volume:
27
Issue Number:
9
Publication Date:
September 2012
View DOI Listing:
https://doi.org/10.1109/TPEL.2012.2187934