March 2024

Conference Paper

2 kV, 0.7 mΩ•cm2 Vertical Ga2O3 Superjunction Schottky Rectifier with Dynamic Robustness

By:
Qin, Yuan; Porter, Matthew; Xiao, Ming; Du, Zhonghao; Zhang, Hongming J; Ma, Yunwei; Spencer, Joseph; Wang, Boyan; Song, Qihao; Sasaki, Kohei; Hung lin, Chia; Kravchenko, Ivan I; Briggs, Dayrl P; Hensley, Dale K; Tadjer, Marko; Wang, Han; Zhang, Yuhao
Page Number:
1-4
Book Title:
2023 International Electron Devices Meeting (IEDM)
Publication Date:
March 2024
Publisher Location:
IEEE, New Jersey, United States of America
Conference Name:
69th Annual IEEE International Electron Devices Meeting (IEDM)
Conference Location:
San Francisco, California, United States of America
Conference Sponsor:
IEEE-IEDM
View DOI Listing:
https://doi.org/10.1109/IEDM45741.2023.10413795

Abstract

We report the first experimental demonstration of a vertical superjunction device in ultra-wide bandgap (UWBG) Ga 2 O 3 . The device features 1.8 μm wide, 2×10 17 cm -3 doped n-Ga 2 O 3 pillars wrapped by the charge-balanced p-type nickel oxide (NiO). The sidewall NiO is sputtered through a novel self-align process. Benefited from the high doping in Ga 2 O 3 , the superjunction Schottky barrier diode (SJ-SBD) achieves a ultra-low specific on-resistance (R ON,SP ) of 0.7 mΩ•cm 2 with a low turn-on voltage of 1 V and high breakdown voltage (BV) of 2000 V. The R ON,SP ~BV trade-off is among the best in all WBG and UWBG power SBDs. The device also shows good thermal stability with BV > 1.8 kV at 175 °C. In the unclamped inductive switching tests, the device shows a dynamic BV of 2.2 kV and no degradation under 1.7 kV repetitive switching, verifying the fast acceptor depletion in NiO under dynamic switching. Such high-temperature and switching robustness are reported for the first time in a heterogeneous superjunction. These results show the great potential of UWBG superjunction power devices.