Process window estimation in manufacturing through Entropy-Sigma active learning

Abstract

In manufacturing, there exist boundary identification problems for defining parameter spaces that meet desired thresholds on outcomes. This paper presents an Entropy-Sigma acquisition function for active learning of the process window/map in manufacturing using a Gaussian Process surrogate. The method is applied to identify the stability boundary for the stability process map in machining using time-domain simulations with a periodic sampling stability metric. Results show that the proposed Entropy-Sigma method significantly outperforms Latin hypercube sampling or grid-based methods. The described method can be applied to identify the process window/map for any manufacturing application using a quantitative process outcome metric.