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Magnetic Tunnel Junctions Based on CrO2/SnO2 Epitaxial Bilayers...

by G. Miao, P. Leclair, A. Gupta, Maria Varela Del Arco, Stephen J Pennycook
Publication Type
Journal
Journal Name
Applied Physics Letters
Publication Date
Page Number
022511
Volume
89
Issue
2

Magnetic tunnel junctions (MTJs) were fabricated using thin films of the half-metallic ferromagnet CrO2, employing semiconducting SnO2 tunnel barriers. Heteroepitaxial CrO2/SnO2 bilayers were grown on (100)-TiO2 substrates via chemical vapor deposition under atmospheric conditions. X-ray diffraction and transmission electron microscopy were used to confirm heteroepitaxy. A polycrystalline cobalt film forms the top magnetic electrode, yielding CrO2(001)/SnO2(001)/Co structures after patterning. Tunneling magnetoresistances (TMR) up to +14% at 5 K were observed. The sign of the TMR reverses for barrier thicknesses < 1nm, attributed to tunneling being dominated by Co-3d states at low thicknesses, and Co-4s states at larger thicknesses.