Publication Type
Journal
Journal Name
Physical Review B
Publication Date
Page Number
14515
Volume
79
Issue
1
Abstract
The grain boundary network in high-<i>T<sub>c</sub></i> coated conductors consists of a large number of low angle grain boundaries with many types of misorientation. Using the bicrystal technique we have measured the critical current densities of the relevant YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-�</sub> grain boundary misorientations as a function of grain boundary angle. We find that in the low angle regime [010]-tilt boundaries and [100]-twist boundaries reduce the critical current density much less than [001]-tilt boundaries. Transmission electron microscopy reveals a low defect density in these boundaries and we find that CuO<sub>2</sub> planes cross these boundaries without interruption.
