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Epitaxial growth of CdTe thin film on cube-textured Ni by metal-organic chemical vapor deposition...

Publication Type
Journal
Journal Name
Thin Solid Films
Publication Date
Page Numbers
1862 to 1865
Volume
520
Issue
6

CdTe thin film has been grown by metalorganic chemical vapor deposition (MOCVD) on
Ni(100) substrate. Using x-ray pole figure measurements we observed the epitaxial relationship
of {111}CdTe// {001}Ni with [110]CdTe//[010]Ni and [112] CdTe//[100]Ni. The 12 diffraction peaks in
the (111) pole figure of CdTe film and their relative positions with respect to the four peak
positions in the (111) pole figure of Ni substrate are consistent with four equivalent orientational
domains of CdTe with three to four superlattice match of about 0.7% in the [110] direction of
CdTe and the [010] direction of Ni. The electron backscattered diffraction (EBSD) images show
that the CdTe domains are 30 degrees orientated from each other.