Abstract
Phase layer growth and interdiffusion in the binary Mg-Zn system was investigated utilizing solid-to-solid diffusion couples annealed at 295°, 315° and 325°C for 21, 7 and 5 days, respectively. The diffusion microstructure was examined by scanning electron microscopy and concentration profiles were determined using X-ray energy dispersive spectroscopy and electron microprobe analysis. The Mg solid solution, Mg2Zn11, MgZn2 and Mg2Zn3 in all three couples were observed in addition to the high temperature, Mg51Zn20 phase at 325°C. The MgZn2 phase was observed to grow the thickest layer, followed by the Mg2Zn3 and the Mg2Zn11 phases. Activation energies for the parabolic growth were calculated to be 105 kJ/mol and 207 kJ/mol for the Mg2Zn3 and MgZn2, respectively. Relevant interdiffusion coefficients were calculated for the phases present by analyses of concentration profiles. This study was sponsored by the US Department of Energy, Office of Energy Efficiency and Renewable Energy, Vehicle Technologies Program (DE-AC05-00OR22725).