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Application of Direct Current Potential Drop for the J-integral vs. Crack Growth Resistance Curve Characterization...

by Xiang Chen, Randy K Nanstad, Mikhail A Sokolov
Publication Type
Conference Paper
Book Title
ASTM STP 1584
Publication Date
Page Numbers
97 to 112
Volume
N/A
Publisher Location
West Conshohocken, Pennsylvania, United States of America
Conference Name
Fourth Symposium on the Evaluation of Existing and New Sensor Technologies for Fatigue, Fracture and Mechanical Testing
Conference Location
Toronto, Canada
Conference Sponsor
ASTM
Conference Date
-

The direct current potential drop (DCPD) technique has been applied to derive the J-integral vs. crack growth resistance curve (J-R curve) for fracture toughness characterization of structural materials. The test matrix covered three materials including type 316LN stainless steels, Ni-based alloy 617, and one ferritic-martensitic steel, three specimen configurations including standard compact, single edge bending, and disk-shaped compact specimens, and temperatures ranging from 20°C to 650°C. When compared with baseline J-R curves derived from the ASTM normalization method, the original J-R curves from the DCPD technique yielded much smaller Jq values due to the influence of crack blunting, plastic deformation, etc. on potential drop. To counter these effects, a new procedure for adjusting DCPD J-R curves was proposed. After applying the new adjustment procedure, the average difference in Jq between the DCPD technique and the normalization method was only 5.2% and the difference in tearing modulus was 7.4%. The promising result demonstrates the applicability of the DCPD technique for the J-R curve characterization especially in extreme environments, such as elevated temperatures, where the conventional elastic unloading compliance method faces considerable challenges.