Abstract
Recent advances in aberration-corrected electron microscopy have allowed researchers to image
materials at sub-Ångström resolution. Many of these modern instruments are designed to be
operated from separate 'control' rooms, removing the effect of the operator on the instrument’s
physical environment. This capability also allows operation from suitable workstations, over
internet connections, from literally anywhere in the world [1]. Researchers at the University of
Texas at Austin (UTA) have collaborated with Oak Ridge National Laboratory (ORNL) and JEOL
Ltd. to routinely conduct research sessions in which high-resolution images and X-ray
microanalytical data are acquired during after-hours research sessions, utilizing the JEOL 2200FS
aberration-corrected STEM/TEM at ORNL from their lab in Austin. Details of the remote operation
are presented here.
