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Scanning probe microscopes use an atom-sharp tip—only a few nanometers thick—to image materials on a nanometer length scale. The probe tip, invisible to the eye, is attached to a cantilever (pictured) that moves across material surfaces like the tone arm on a record player. Credit: Genevieve Martin/Oak Ridge National Laboratory; U.S. Dept. of Energy.

Liam Collins: Mapping the unseen

Liam Collins was drawn to study physics to understand “hidden things” and honed his expertise in microscopy so that he could bring them to light.

ORNL researcher Karren More has been elected fellow of the Microscopy Society of America.

Microscopy Society of America elects ORNL's Karren More fellow

OAK RIDGE, Tenn., March 22, 2019 – Karren Leslie More, a researcher at the Department of Energy’s Oak Ridge National Laboratory, has been elected fellow of the Microscopy Society of America (MSA) professional organization.

To develop complex materials with superior properties, Vera Bocharova uses diverse methods including broadband dielectric spectroscopy. Credit: Oak Ridge National Laboratory, U.S. Dept. of Energy; photographer Jason Richards

Vera Bocharova: Advancing the frontiers of knowledge about soft materials

Vera Bocharova at the Department of Energy’s Oak Ridge National Laboratory investigates the structure and dynamics of soft materials—polymer nanocomposites, polymer electrolytes and biological macromolecules—to advance materials and technologies for energy, medicine and other applications.

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