July 2025

Conference Paper

Electron Ptychography via Differentiable Programming

By:
Mukherjee, Debangshu ; Sankaran, Ramanan ; Boebinger, Matthew G
Journal Name:
Microscopy and Microanalysis
Page Number:
ozaf048.03
Volume:
31
Issue Number:
Supplement
Publication Date:
July 2025
Conference Name:
Microscopy & Microanalysis
Conference Location:
Salt Lake City, Utah, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1093/mam/ozaf048.038