August 2018

Conference Paper

Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.

By:
Oxley, Mark P; Birenbaum, Yael L; Pandey, Tribhuwan ; Cooper, Valentino R; Chi, Miaofang
Journal Name:
Microscopy and Microanalysis
Page Number:
116-117
Volume:
24
Issue Number:
S1
Publication Date:
August 2018
Conference Name:
Microscopy and Microanalysis
Conference Location:
Baltimore, Maryland, United States of America
Conference Sponsor:
Micoscopy Society of America
View DOI Listing:
https://doi.org/10.1017/S1431927618001071