May 2018

Conference Paper

Quality Assessment of GPU Power Profiling Mechanisms

By:
Sen, Satyabrata ; Imam, Neena ; Hsu, Chung-Hsing
Page Number:
702-711
Issue Number:
1
Book Title:
2018 IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW)
Publication Date:
May 2018
Publisher Location:
IEEE, New Jersey, United States of America
Conference Name:
IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW)
Conference Location:
Vancouver, Canada
Conference Sponsor:
IEEE
View DOI Listing:
https://doi.org/10.1109/IPDPSW.2018.00113

Abstract

Accurate component-level power measurements are nowadays essential for the design and optimization of high-performance computing (HPC) systems and applications. Particularly, as more and more heterogeneous HPC systems are developed, the characterizations of GPU power profiles have become extremely crucial because, although GPUs provide exceptional performance, they do consume substantial amounts of power. Currently, there are various GPU power profiling mechanisms available; however, there is no standard way to assess the quality of such profiling schemes. To address this issue, in this paper, we develop an assessment methodology to rate the quality and performance of the profiling mechanism itself. Specifically, we present the assessments of four different GPU power profiling techniques: (i) Nvidia's NVML via Allinea MAP, (ii) Nvidia's NVML via direct reads, and (iii) Penguin Computing's PowerInsight (PI) via two vendor-provided drivers, and (iv) PowerInsight via Allinea MAP. In addition, we discuss the effects of moving-average filters to explain the slow variations of some of the measured power profiles. Based on our assessment, the GPU power profiling mechanism using PI device outperforms the other schemes by reliably measuring the ground-truth power profile generated by a GPU stress-test benchmark.