August 2013

Conference Paper

New Applications in Atom Probe Tomography

By:
Larson, David; Valley, J; Ushikubo, T; Miller, Michael K; Takamizawa, H; Shimizu, Y; Gordon, L.; Joester, D; Giddings, A.D.; Reinhard, D.A.; Prosa, T; Olson, D. P.; Lawrence, D. F.; Clifton, P.H.; Ulfig, R.M.; Martin, I.Y.; Kelly, T. F.
Page Number:
1022
Volume:
19(S2)
Publication Date:
August 2013
Conference Name:
Microscopy and Microanalysis (M&M 2013)
Conference Location:
Indianapolis, Indiana, United States of America