March 2014

Journal

Focused-Ion-Beam induced damage in thin films of complex oxide BiFeO3

By:
Siemons, Wolter ; Fowlkes, Jason D; Wisinger, Nina ; Tischler, Jonathan; Xu, Ruqing; Liu, W.; Gonzales, C; Budai, John D; Christen, Hans M
Journal Name:
APL Materials
Page Number:
022109
Volume:
2
Issue Number:
2
Publication Date:
March 2014
View DOI Listing:
https://doi.org/10.1063/1.4866051