July 2011

Journal

Formation of stacking faults and their correlation with flux-pinning and critical current density for Sm-doped YBa2Cu3O7-δ films

By:
Wee, Sung Hun ; Specht, Eliot D; Cantoni, Claudia ; Zuev, Yuri L; Maroni, Victor; Wong-Ng, W.; Liu, G.; Haugan, T.; Goyal, Amit
Journal Name:
Physical Review B
Page Number:
224520
Volume:
83
Issue Number:
22
Publication Date:
July 13, 2011
View DOI Listing:
https://doi.org/10.1103/PhysRevB.83.224520

Abstract

A correlation between flux-pinning characteristics and stacking faults (SFs) formed by Sm substitution on Y and Ba sites was found in Sm-doped YBa2Cu3O7-δ (YBCO) films. It was confirmed that “223” type SFs, Y2Ba2Cu3Ox, composed of extra Y and O planes aligned parallel to the ab-planes formed via Sm substitution on the Y site and increased in number with increasing Sm doping on the Ba site. The number density of “223” SFs is correlated strongly with the enhancement in ab-plane correlated flux-pinning, resulting in a sharpening of the H║ab peak in the plot of critical current density versus magnetic field orientation.