September 2011

Conference Paper

Atomic Scale Study of Point Defects in Graphene using STEM

By:
Zhou, Wu ; Prange, Micah P; Oxley, Mark P; Pantelides, Sokrates; Pennycook, Stephen J; Nanda, Jagjit ; Narula, Chaitanya K; Idrobo Tapia, Juan C
Publication Date:
September 30, 2011
Conference Name:
Microscopy & Microanalysis 2011 Meeting
Conference Location:
Nashville, Tennessee, United States of America