August 2025

Conference Paper

A Typology of Quantum-Classical Faults

By:
Giusto, Edorado; Núñez-Corrales, Santiago; Cilardo, Alessandro; Mazzocca, Nicola; Humble, Travis S
Page Number:
188-195
Book Title:
2025 55th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)
Publication Date:
August 2025
Publisher Location:
IEEE, New Jersey, United States of America
Conference Name:
2025 55th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)
Conference Location:
Naples, Italy
Conference Sponsor:
IEEE
View DOI Listing:
https://doi.org/10.1109/DSN-W65791.2025.00060

Abstract

This paper introduces an extended taxonomy of faults specific to hybrid quantum-classical systems, addressing the unique challenges that arise from integrating quantum accelerators into high-performance computing (HPC) infrastructures. Building on the foundational fault classification by Avizienis et al., we incorporate fault types unique to quantum computing-such as qubit decoherence, spontaneous gate errors, and photon loss-alongside traditional and human-induced faults including development errors, operational mistakes, and malicious attacks. Our taxonomy classifies faults by their origin (natural vs. human-made), intent (accidental, deliberate non-malicious, or malicious), system boundaries (internal vs. external), and persistence (transient to permanent). We also explore how different architectural integration patterns-ranging from tight coupling to loose on-premise and cloud-based configurations-shape the manifestation and propagation of faults. These scenarios are analyzed in terms of timing mismatches, interface inconsistencies, and security threats such as data tampering and denial-of-service attacks. Through this fault-centric lens, we aim to support the co-design of dependable quantum-classical systems and highlight the critical role that integration strategies play in ensuring reproducibility, resilience, and security across hybrid computing platforms.


Related Researchers