Publication Type
Journal
Journal Name
TMS Letters
Publication Date
Page Numbers
5 to 6
Volume
3
Issue
1
Abstract
The solute distributions in crept and annealed single crystal CMSX-4 nickel-based superalloy have been characterized from multi-million atom data sets obtained with the local electrode atom probe. Solute-depleted and solute-enriched regions are evident on both sides of the �� - ���� interface.
Ultrafine (~1 nm diameter) rhenium clusters containing up to ~10-15% Re were evident in the 10-nm wide Reenriched region in the matrix close to the �� - ���� interface. Re-enriched regions were also detected in asperities in the ��
- ���� interface in the crept conditions.