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Feature Classification for Control System Devices...

by M Ahmed Mithu, Mike Rogers, Denis Ulybyshev, Rajesh Manicavasagam, Rima L Asmar Awad
Publication Type
Conference Paper
Journal Name
The International FLAIRS Conference Proceedings
Publication Date
Page Numbers
1 to 4
Conference Name
The Florida Artificial Intelligence Research Society
Conference Location
North Miami Beach, Florida, United States of America
Conference Sponsor
Conference Date

Control systems are used to automate industrial processes, smart grids, and smart cities. Unfortunately, cyber attacks on control systems are on the rise. Additionally, control systems lack the plethora of tools available for commodity systems for forensic investigation. An important step towards the proper forensic investigation is to analyze device memory. To assist in identifying features of device memory, we present a machine learning-based technique that integrates ontology information for feature classification in a control system device’s memory.