A simple, optical method to determine how two-dimensional layers are stacked in a crystal

An optical method (Terahertz Raman spectroscopy) was developed for fast remote screening of layer stacking in new two-dimensional (2D) materials, which is orders of magnitude faster than conventional electron microscopy. “Low-Frequency Raman Fingerprints of Two-Dimensional Metal Dichalcogenide Layer Stacking Configuration” (highlight slide) Puretzky et al., ACS Nano(2015) | DOI:10.1021/acsnano.5b01884