Scientific Achievement
A simple model explains and predicts the dependence of low-frequency Raman scattering on complex stacking sequences in two-dimensional materials.
Significance and Impact
The model forms a complete road map of low-frequency Raman signatures of stacking configurations and thickness dependence in 2D materials; a key to effective characterization and control.
Research Details
- A mathematical, interlayer bond polarizability model was developed and successfully applied for a broad class of low-D materials.
- DFT and experiments validate the model.
L. Liang, A. A. Puretzky, B. G. Sumpter, V. Meunier, “Interlayer bond polarizability model for stacking-dependent low-frequency Raman scattering in layered materials,” Nanoscale, accepted for publication (2017). DOI: 10.1039/C7NR05839J
