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Researcher
- Hongbin Sun
- Kyle Kelley
- Rama K Vasudevan
- Sergei V Kalinin
- Annetta Burger
- Anton Ievlev
- Bogdan Dryzhakov
- Carter Christopher
- Chance C Brown
- Debraj De
- Gautam Malviya Thakur
- Ilias Belharouak
- James Gaboardi
- Jason Jarnagin
- Jesse McGaha
- Kevin M Roccapriore
- Kevin Spakes
- Kevin Sparks
- Liam Collins
- Lilian V Swann
- Liz McBride
- Mark Provo II
- Marti Checa Nualart
- Maxim A Ziatdinov
- Neus Domingo Marimon
- Olga S Ovchinnikova
- Pradeep Ramuhalli
- Praveen Cheekatamarla
- Rob Root
- Ruhul Amin
- Sam Hollifield
- Stephen Jesse
- Steven Randolph
- Thien D. Nguyen
- Todd Thomas
- Vishaldeep Sharma
- Xiuling Nie
- Yongtao Liu

In nuclear and industrial facilities, fine particles, including radioactive residues—can accumulate on the interior surfaces of ventilation ducts and equipment, posing serious safety and operational risks.

Often there are major challenges in developing diverse and complex human mobility metrics systematically and quickly.

The ever-changing cellular communication landscape makes it difficult to identify, map, and localize commercial and private cellular base stations (PCBS).

The invention presented here addresses key challenges associated with counterfeit refrigerants by ensuring safety, maintaining system performance, supporting environmental compliance, and mitigating health and legal risks.

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

Knowing the state of charge of lithium-ion batteries, used to power applications from electric vehicles to medical diagnostic equipment, is critical for long-term battery operation.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.