Postdoctoral Research Associate
Advanced scanning probe microscopy technique development - complete signal acquisition combined with data analytics, signal processing to extract all information about cantilever / sample response at speeds that are orders of magnitude faster than current state-of-art
Developing a cross-divisional software platform using high performance computing at ORNL to bring together the data and expertise of experimentalists, theoreticians, and data scientists together to dramatically improve the quality and speed of materials research.
Microscopy - AFM, SEM
High speed data acquisition