Mark P Oxley Research Staff Member Contact oxleymp@ornl.gov Publications Three-Dimensional Imaging of Individual Hafnium Atoms Inside a Semiconductor Device... Journal: Applied Physics Letters July, 2005 Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface Roughness... Journal: Microscopy and Microanalysis April, 2005 The Spatial Resolution of Imaging Using Core-Loss Spectroscopy in the Scanning Transmittion Electron Microscope... Journal: Ultramicroscopy March, 2005 Pagination First page « First Previous page ‹‹ … Page 11 Page 12 Current page 13 View All Key Links Curriculum Vitae ORCID
Three-Dimensional Imaging of Individual Hafnium Atoms Inside a Semiconductor Device... Journal: Applied Physics Letters July, 2005
Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface Roughness... Journal: Microscopy and Microanalysis April, 2005
The Spatial Resolution of Imaging Using Core-Loss Spectroscopy in the Scanning Transmittion Electron Microscope... Journal: Ultramicroscopy March, 2005