Kenneth William Tobin Jr

Kenneth William Tobin Jr

Division Director / Corporate Research Fellow

Bio

Dr. Kenneth W. Tobin is the Director of the Reactor and Nuclear Systems Division (RNSD) at the Oak Ridge National Laboratory (ORNL), Oak Ridge, Tennessee, USA, where he has been working in various R&D and leadership capacities since 1987. RNSD is composed of 130 staff who provide the science and technology to address issues facing current and future utilization of nuclear reactors and supporting nuclear systems infrastructure. RNSD is committed to leadership class research and development that delivers innovative technical solutions, advanced technologies, and state-of-the-art simulation and experimental capabilities and data to advance the economics, operations, and security of current and future nuclear systems. Dr. Tobin was named an ORNL Corporate Research Fellow in 2003 for his contributions to the field. He has authored and co-authored over 164 publications and he currently holds fourteen U.S. Patents in areas of computer vision, photonics, radiography, and microscopy. Dr. Tobin is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and a Fellow of the International Society for Optics and Photonics (SPIE). Dr. Tobin has a Ph.D. in Nuclear Engineering from the University of Virginia, an M.S. in Nuclear Engineering from Virginia Tech, and a B.S. in Physics also from Virginia Tech.

Awards

Battelle Distinguished Inventor, Battelle Memorial Institute, 2015.

Elected to the grade of Fellow of IEEE, The Institute of Electrical and Electronics Engineers, January 2012.

American Telemedical Association (ATA) Innovation Award for development of the TRIAD Ocular Telehealth Network, April 2011.

Southeast Region Federal Laboratory Consortium Award for “TRIAD (Telemedical Retinal Image Analysis and Diagnosis),” recognition for Excellence in Technology Transfer, October 2010.

R&D Magazine’s R&D 100 Award for applied research in the development of the Telemedical Retinal Image Analysis and Diagnosis (TRIAD) System and Technology, November 2010.

Southeast Region Federal Laboratory Consortium Award for " Automated Image Retrieval: Semiconductor-Specific Image Retrieval Method and System", recognition for Excellence in Technology Transfer, August 2007.

SPIE Symposium on Medical Imaging, Conference on Visualization, Image-Guided Procedures, and Display, “Best Poster” of session and “Cum Laude” poster, February 2006.

National Federal Laboratory Consortium Award for " MicroCAT Small Animal Imaging System ", recognition for Excellence in Technology Transfer, May 2005.

Southeast Region Federal Laboratory Consortium Award for "MicroCAT Small Animal Imaging System", recognition for Technology Transfer Project of the Year, September 2004.

Elected to the grade of Senior Member of IEEE, The Institute of Electrical and Electronics Engineers, August 2004.

National Federal Laboratory Consortium Award for "Automated Image Retrieval System for Semiconductor Yield Improvement", recognition for Excellence in Technology Transfer, May 2003.

Southeast Region Federal Laboratory Consortium Award for "Automated Image Retrieval Technology", recognition for Excellence in Technology Transfer, January 2003.

R&D Magazine’s R&D 100 Award for applied research in the development of the Defect Source Identifier – Automated Image Retrieval (DSI-AIR) System for Semiconductor Image Data Management, 2002.

National Federal Laboratory Consortium Award for Excellence in Technology Transfer, "Direct-to-Digital Holography for High-Speed, High Resolution Defect Inspection", March 2002.

Southeast Region Federal Laboratory Consortium Award for "Direct-to-Digital Holography for High-Speed, High Resolution Defect Inspection", recognition for the new category of Excellence in Technology Transfer Award of the Year, November 2002.

Elected to the grade of Fellow of SPIE, The International Society for Optics and Photonics, March 2001.

Tennessee Academy of Science, Industrial Scientist of the Year, for Leadership and Scientific Contributions to Semiconductor Metrology, November 2000.

American Museum of Science and Energy Award for Marketed Technology for the “Spatial Signature Analysis Software System”, May 1998.

National Federal Laboratory Consortium Award for Excellence in Technology Transfer, “Spatial Signature Analysis System for Semiconductor Yield
Improvement”, March 1998.

Publications

Tobin, K.W., Fowler, K., Fuhr, P., McIntyre, T., “The Future of Instrumentation,” The IEEE Instrumentation and Measurement Magazine, April 2013.

Giancardo, L., Meriaudeau, F., Karnowski, T.P., Li, Garg, S., Tobin, K.W., Chaum, E., “Exudate-based Diabetic Macular Edema Detection in Fundus Images Using Publicly Available Datasets,” Medical Image Analysis, Vol. 16, No. 1, January 2012.

Li, Y., Karnowski, T.P., Tobin, K.W., Giancardo, L., Morris, S., Sparrow, S.E., Garg, S., Fox, K., Chaun, E., “A Health Insurance Portability and Accountability Act-Compliant Ocular Telehealth Network for the Remote Diagnosis and Management of Diabetic Retinopathy,” Telemedicine and e-Health, Vol. 17, No. 8, October 2011.

Giancardo, L., Meriaudeau, Karnowski, T.P., Tobin, K.W., Favaro, P., Ruggeri, A., Chaum, E., “Textureless Macula Swelling Detection with Multiple Retinal Fundus Images,” IEEE Transactions on Biomedical Engineering, Vol. 58, No. 3, March 2011.

Paquit, V.C., Tobin, K.W., Price, J.R., Mériaudeau, F., “3D and Multispectral Imaging for Subcutaneous Veins Detection,” Optics Express, Vol. 17, No. 14, July 2009, pp. 11360-11365.

Mann, C., Binham, P.R., Paquit, V., Tobin, K.W., “Quantitative Phase Imaging by Three-Wavelength Digital Holography,” Optics Express, Vol. 16, No. 13, 2008, pp. 9753-9764.

Chaum, E., Abdelrahman, M., Karnowski T.P., Govindasamy, P.G., Tobin, K.W., “Automated Diagnosis of Retinopathy by Content-Based Image Retrieval,” Retina, Vol. 28, No. 10, Nov.-Dec. 2008, pp 1463-77.

Tobin, K.W., Chaum, E., Govindasamy, V.P., Karnowski, T.P., “Detection of Anatomic Structures in Human Retinal Imagery,” IEEE Transactions on Medical Imaging, Vol. 26, No. 12, December 2007.

Bourgeat, P., Tobin, K.W., Gorria, P., Meriaudeau, F., “Gabor Feature Extraction on Complex Images: Application to Defect Detection on Semiconductors,” The Imaging Science Journal, Vol. 54, No. 4, December 2006.

Tobin, K.W., Bhaduri, B.L., Bright, E.A., Cheriyadat, A., Karnowski, T.P., Palathingal, P.J., Potok, T.E., Price, J.R., “Automated Feature Generation in Large-Scale Geospatial Libraries for Content-Based Indexing,” Journal of Photogrammetric Engineering and Remote Sensing, Vol. 72, No. 5, May 2006.

Paquit, Vincent C., Ferrell, Thomas L., Meriaudeau, Fabrice, Price, Jeffery R., Seulin, Ralph, Tobin Jr, Kenneth W., Farahi, R H., "Near-infrared imaging and structured light ranging for automatic catheter insertion," Progress in Biomedical Optics and Imaging, Vol. 7, no 27, Mar 2006.

Bingham, P.R., Price, J.R., Tobin, K.W., Karnowski, T.P., “Semiconductor Sidewall Shape Estimation,” SPIE Journal of Electronic Imaging, Vol. 13, No. 3, July 2004.

Bourgeat, P., Meriaudeau, F., Tobin, K.W., Gorria, P., “Patterned Wafer Segmentation,” SPIE Journal of Electronic Imaging, Vol. 13, No. 3, July 2004.

Weber, C., Sankaran, V., Tobin, K.W., “Quantifying the Value of Ownership of Yield Analysis Technologies”, IEEE Transactions on Semiconductor Manufacturing, Vol. 15, No. 4, November 2002.

Tobin, K. W., Karnowski, T.P., Arrowood, L.F., Ferrell, R.K., Goddard, J.S., Lakhani, F., “Content-based Image Retrieval for Semiconductor Process Characterization”, EURASIP Journal on Applied Signal Processing, Vol. 2002, No. 7, 2002.

Tobin, K.W., Karnowski, T.P., “Revolutionizing Defect Image Management”, SPIE’s OE Magazine, Vol 1, No. 7, July 2001.

Tobin, K.W., Bingham, P.R., Price, J.R., and Bennett, M.H., "An Application of Image Retrieval Technology to Sidewall Structure Estimation from Top-down SEM Imagery", SCANNING, The Journal of Scanning Microscopies, Vol. 23, No. 2, March / April 2001.

Karnowski, T.P., Gleason, S.S., and Tobin, K.W., "Fuzzy Logic Connectivity in Semiconductor Defect Clustering," SME Technical Paper MS00-240, Society of Manufacturing Engineers, Dearborn, MI, 2000.

Tobin, K.W., Karnowski, T.P., Lakhani, F., “Technology Considerations for Future Semiconductor Data Management Systems”, Semiconductor Fabtech, Vol. 12, ICG Publishing, Ltd., London, England, Spring 2000.

Jensen, D., Long, C., Worley, R, Lakhani, F., Tobin, K., “Comparing the Defect Reduction Sections of the Most Recent Versions of the Roadmap”, Micro, Canon Communications, LLC, Los Angelis, CA, January 2000.

Tobin, K.W., Karnowski, T.P., and Lakhani, F. "Managing Defect Image Databases for Semiconductor Yield Monitoring and Control", Global Semiconductor, Sterling Publications, London, England, February 2000.

Tobin, K.W., Karnowski, TP., Gleason, S.S., Jensen, D., Lakhani, F., “Using Historical Wafermap Data for Automated Yield Analysis”, Journal of Vacuum Science Technology, Summer 1999.

Gross, C., Tobin, K., Jensen, D., and Mehta, D., “Future Technology Requirements for Rapid Isolation and Sourcing of Faults”, Micro, Canon Communications, LLC, Los Angelis, CA, July 1998.

Tobin, K.W., Gleason, S.S., Karnowski, T.P., Bennett, M.H., “Semiconductor Defect Data Reduction for Process Automation and Characterization”, Journal of Process and Analytical Chemistry, Vol. 3, Nos. 3,4, Spring 1998.

Tobin, K.W., Gleason, S.S., Karnowski, T.P., Guidry, D., “Using SSA to Measure the Efficacy of Automated Defect Data Gathering”, Micro, Canon Communications, LLC, Los Angelis, CA, April 1998.

Tobin, K.W. Gleason, S.S., Lakhani, F., and Bennett, M.H., “Automated Analysis for Rapid Defect Sourcing and Yield Learning”, Future Fab International, Vol. 4, 1997.

Gleason, S.S., Tobin, K.W., and Karnowski, T.P., “Spatial Signature Analysis of Semiconductor Defects for Manufacturing Problem Diagnosis”, Solid State Technology, PennWell Corp., Tulsa, OK, July 1996.

Tobin, K.W., “Machine Vision Expertise Can Lead to Industrial Success”, Laser Focus World, PennWell Corp., Tulsa, OK, September 1994.

Tobin, K.W., “How Oak Ridge National Lab Fosters Automated Inspection”, Advanced Imaging, Cygnus Business Media, Inc., Westport, CT, July 1993.

Dever, D., Bugos, A. R., Alexeff, I., Dyer, F., Cates, M. R., Tobin, K. W., Beshears, D. L., and Capps, G. J., “Surface Temperature Measurement Using A Thermographic Phosphor During Irradiation By Microwave Energy”, Journal of Microwave Power and Electromagnetic Energy, 1990.

Tobin, K. W., Allison, S. W., Cates, M. R., Capps, G. J., Beshears, D. L., and Cyr, M., “Remote High-Temperature Phosphor Thermometry of Rotating Turbine Blades”, AIAA Journal, Vol. 28, No. 8, August 1990.

Tobin, K. W., Brenizer, J. S., and Mait, J. N., “Three-Dimensional Information from Real-Time Encoded Images”, Optical Engineering, Vol. 29, No. 1, January 1990.

Tobin, K. W., Brenizer, J. S., and Mait, J. N., “Modulation Transfer Function Technique for Real-Time Radioscopic System Characterization”, Applied Optics, Vol. 28, No. 23, 1989.

Sulcoski, M. F., Tobin, K. W., and Brenizer, J. S., “Real-Time Neutron Radiography System Performance, Measurements and Methods”, Nuclear Technology, Vol. 82, September 1988.

McRae, D. D., Brenizer, J. S., Tobin K. W., Hosticka, B., and Sulcoski, M. F., “Quantitative Density Measurement from a Real-Time Neutron Radiography System”, Trans. of the American Nuclear Society, November 1986.

Brenizer, J. S., Tobin, K. W., Hylko, J. M., McRae, D. D., and Jenkins, R. W., Jr., “Quantitative Measurement of Effective Water Density in a Burning Cigarette”, Materials Evaluation, Vol. 45, No. 11, November 1987.

Brenizer, J. S., Sulcoski, M. F., Tobin, K. W., Jenkins, R. W., and McRae, D. D., “Evaluation of Filter Behavior by Neutron Radiography”, Journal of Aerosol Science, 18:3, 1987.

Bingham, P., Bilheux, H., Santos-Villalobos, H., Gregor, J., Tobin, K.W., “Potential for Coded Source Radiography for VENUS at SNS,” 5th Neutron Wavelength Dependent Imaging Workshop, Lund, Sweden, April 21-24, 2013.

Karnowski, T.P., Giancardo, L., Li, Y., Tobin, K.W., Chaum, E., “Retina Image Analysis and Ocular Telehealth: The Oak Ridge National Laboratory-Hamilton Eye Institute Case Study,” in 35th Annual International IEEE EMBS Conference, Osaka, Japan, July 3-7, 2013.

Giancardo, L., Meriaudeau, F., Karnowski, T.P., Tobin, K.W., Chaum, E., “Validation of Microaneurysm-based Diabetic Retinopathy Screening across Retina Fundus Datasets,” 26th International Symposium on Computer-Based Medical Systems, Porto, Portugal, June 20-22, 2013.

Paquit, V., Karnowski, T.P., Aykac, D., Li, Y., Tobin, K.W., Chaum, E., “Detecting Flash Artifacts in Fundus Imagery,” in 34th Annual International IEEE EMBS Conference, San Diego, CA, August 28, 2012.

Santos-Villalobos H, Karnowski T.P., Aykac D., Giancardo L., Li Y., Nichols T., Tobin K.W. Jr, Chaum E., “Statistical Characterization and Segmentation of Drusen in Fundus Images,” in 33rd Annual International IEEE EMBS Conference, Boston, MA, September 3, 2011:6236-41.

Giancardo, L., Meriaudeau, F., Karnowski, T.P., Li, Y., Tobin, K.W., Chaum, E., “Microaneurysm Detection with Radon Transform-Based Classification on Retina Images,” in 33rd Annual International IEEE EMBS Conference, Boston, MA, September 3, 2011.

Karnowski, T.P., Aykac, D., Giancardo, L., Nichols, T.L., Li, Y., Tobin, K.W., Chaum, E., “Automatic Detection of Retina Disease: Robustness to Image Quality and Localization of Anatomy Structure,” in 33rd Annual International IEEE EMBS Conference, Boston, MA, September 3, 2011.

Giancardo, L., Meriaudeau, F., Karnowski, T.P., Li, Y., Tobin, K.W., Chaum, E., “Quality Enhancement and Nerve Fibre Layer Artefacts in Retina Fundus Images by Off Axis Imaging,” IEEE International Conference on Image Processing, Brussels, Belgium, September 2011.

Bingham, P., Santos-Villalobos, H., Tobin, K., "Coded source neutron imaging" in Image Processing: Machine Vision Applications IV, edited by David Fofi, Philip R. Bingham, Proceedings of SPIE Vol. 7877 (SPIE, Bellingham, WA 2011) 78770M, January 2011.

Giancardo, L., Mériaudeau, F., Karnowski, T. P., Tobin, K. W., Li, Y., Chaum, E., "Microaneurysms detection with the radon cliff operator in retinal fundus images" in Medical Imaging 2010: Image Processing, edited by Benoit M. Dawant, David R. Haynor, Proceedings of SPIE Vol. 7623 (SPIE, Bellingham, WA 2010) 76230U.

Ziao, Z., Mishra, K. K., Hawari, A. I., Bilheux, H. Z., Bingham, P. R., Tobin, K. W., “Investigation of Coded Source Neutron Imaging at the North Carolina State University PULSTAR Reactor,” IEEE Nuclear Science Symposium, Orlando, FL, October 25-31, 2009.

Karnowski, T., Aykac, D., Chaum, E., Giancardo, L., Li, Y., Tobin, K., Abramoff, M., “Evaluating the Accuracy of Optic Nerve Detection in Retina Imaging Using Complementary Methods,” Medical Physics and Biomedical Engineering, World Congress 2009, Munich, Germany, September 7-12, 2009.

Giancardo, L., Karnowski, T., Chaum, E., Mériaudeau, F., Tobin, K., Li, Y., “Bright Retinal Lesions Detection Using Color Fundus Images Containing Reflective Features,” Medical Physics and Biomedical Engineering, World Congress 2009, Munich, Germany, September 7-12, 2009.

Karnowski, T., Aykac, D., Chaum, E., Giancardo, L., Li, Y., Tobin, K., Abramoff, M.D., “Practical Considerations for Optic Nerve Location in Telemedicine,” in 31st Annual International Conf. of the IEEE EMBS, Hilton Minneapolis, Minnesota, September 2009.

Mériaudeau, F., Paquit, V., Price, J., Tobin, K., “3D Multispectral Imaging for Subcutaneous Veins Detection,” IEEE International Conf. on Image Processing, Cairo, Egypt, Nov. 7-11, 2009.

Tobin, K.W., Abramoff, M.D., Chaum, E., Giancardo, L., Govindasamy, V.P., Karnowski, T.P., Tennant, M.T.S., “Using a Patient Image Archive to Diagnose Retinopathy,” in 30th Annual International Conf. of the IEEE EMBS, Vancouver, Canada, August 2008.

Giancardo, L., Abramoff, M.D., Chaum, E., Karnowski, T.P., Meriaudeau, F., and Tobin, K.W.,"Elliptical Local Vessel Density: a Fast and Robust Quality Metric for Fundus Images," in 30th Annual International Conf. of the IEEE EMBS, Vancouver, Canada, August 2008.

Karnowski, T.P., Govindasamy, V.P., Tobin, K.W., Chaum, E., and Abramoff, M.D., "Retina Lesion and Microaneurysm Segmentation using Morphological Reconstruction Methods with Ground-Truth Data," in 30th Annual International Conf. of the IEEE EMBS, Vancouver, Canada, August 2008.

Mann, C.J., Bingham, P.R., Tobin, K.W., “Three-Wavelength Phase Imaging Digital Holography of MEMS Motion,” Digital Holography and Three-Dimensional Imaging, Optical Society of America, St. Petersburg, Florida, March 17-19, 2008.

Paquit, V., Price, J., Meriaudeau, F., Tobin, K., “3D Multispectral Light Propagation Model For Subcutaneous Veins Imaging,” SPIE Medical Imaging Symposium: Physics and Medical Imaging, San Diego, CA, February 2008.

Raffo-Caiado, A.C., Tobin, K.W., Fischer, D.M., “Satellite Image Analysis Capability for Safeguards Applications,” Institute of Nuclear Materials Management 48th Annual Meeting, Tucson, Arizona, July 8-12, 2007.

Tobin, K.W., Abdelrahman, M., Chaum, E., Govindasamy, P., and Karnowski, T.P., “A Probabilistic Framework for Content-Based Diagnosis of Retinal Disease,” 29th Annual International Conf. of the IEEE EMBS, August 2007, Lyon, France, August 2007.

Price, J., Gee, T., Paquit, V., Tobin, K. “On the Efficacy of Correcting for Refractive Effects in Iris Recognition,” IEEE Computer Society Workshop on Biometrics, Minneapolis, MN, June 18, 2007.

Paquit, V., Price, J., Seulin, R., Meriaudeau, F., Tobin, K., Ferrell, T. “Combining near-infrared illuminants to optimize venous imaging,” SPIE Medical Imaging Symposium, Proceedings of SPIE, Vol 6509, February 2007.

Tobin, K., Chaum E., “Automated screening aids diagnosis of diabetic eye disease,” Biomedical Optics & Medical Imaging, SPIE Newsroom (newsroom.spie.org), September 3, 2006.

Tobin, K.W., Aykac, D., Govindasamy, V.P., Gleason, S.S., Gregor, J., Karnowski, T.P., Price, J.R., and Wall, J., “Image-based Informatics for Preclinical Biomedical Research,” 2nd International Symposium on Visual Computing, LNCS 4292, Springer-Verlag, Berlin, 2006, pp. 1740-1750.

Karnowski, T.P., Govindasamy, V.P., Tobin, K.W., Chaum, E., “Locating the Optic Nerve in Retinal Images: Comparing Model-Based and Bayesian Decision Methods,” 28th Annual International Conf. of the IEEE EMBS, Washington, DC, August 2006, pp. 4436-4439.

Tobin, K.W., Chaum, E., Govindasamy, V.P., Karnowski, T.P., Sezer, O., “Characterization of the Optic Disk in Retinal Imagery using a Probabilistic Approach”, SPIE International Symposium on Medical Imaging, San Diego, California, Proceedings of SPIE, Vol. 6144, February 2006.

Paquit, V., Price, J.R., Seulin, R., Meriaudeau, F., Farahi, R.R., Tobin, K.W., Ferrell, T.L., “Near-infrared imaging and structured light ranging for automatic catheter insertion,” SPIE International Symposium on Medical Imaging, San Diego, California, Proceedings of SPIE, Vol. 6141, February 2006.

Tobin, K.W., Bhaduri, B.L., Bright, E.A., Cheriyadat, A., Karnowski, T.P., Palathingal, P.J., Potok, T.E., Price, J.R., “Large-Scale Geospatial Indexing for Image-Based Retrieval and Analysis,” 1st International Symposium on Visual Computing, LNCS 3804, Springer-Verlag, Berlin, 2005, pp. 543-552.

Tobin, K.W., Bingham, P.R., “Optical Spatial Heterodyned Interferometry for Applications in Semiconductor Inspection and Metrology,” (invited) International Conference on Lasers, Applications, and Technologies, St. Petersburg, Russia, Proceedings of SPIE, Vol. 6162, May 2005.

Bingham, P.R., Hanson, G., Tobin, K.W., Simpson, J., "Spatial heterodyne interferometry technique and applications in semiconductor production,” Interferometry XII: Techniques and Analysis, Proceedings of SPIE Vol. No. 5531, August 2004.

Bourgeat, P, Meriaudeau, F., P. Gorria, P., Tobin, K.W., "Feature Extraction on Complex Images," The International Topical Meeting on Optical Sensing and Artificial Vision, St. Petersburg, Russia, 18-21 October, 2004.

Bingham, P.R., Tobin, K.W., Bennett, M.H., Marmillion, P., “Phase Defect Detection with Spatial Heterodyne Interferometry,” Microlithography, Proceedings of the SPIE Vol. 5378, May 2004.

Bourgeat, P., Meriaudeau, F., Tobin, K.W., Gorria, P., “Comparison of Texture Features for Segmentation of Pattern Wafers,” Proceedings of the SPIE Vol. 5266., Oct. 2003.

Bingham, P.R., Tobin, K.W, Bennett, M.H., Marmillion, P., “Preliminary Results for Mask Metrology Using Spatial Heterodyne Interferometry,” 23rd BACUS Symposium on Photomask Technology, 8-12 September, Monterey Convention Center, Monterey, CA, 2003.

Thomas, C.E., Jr., Hunt, M.A., Bahm, T.M., Baylor, L.R., Bingham, P.R. , Chidley, M.D., Dai, X., Delahanty, R.J., El-Khashab, A., Gilbert, J.M., Goddard, J.S., Hanson, G.R., Hickson, J.D., Hylton, K.W., John, G.C., Jones, M.L., Mayo, M.W., Marek, C., Price, J.H., Rasmussen, D.A., Schaefer, L.J., Schulze, M.A., Shen, B., Smith, R.G., Su, A.N., Tobin, K.W., Usry, W.R., Voelkl, E., Weber, K.S., Owen, R.W., "Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers", International Conference on Characterization and Metrology for ULSI Technology, NIST, Austin, TX, March 24-28, 2003.

Ferrell, R.K, Gleason, S.S., and Tobin, K.W., “Application of Fractal Encoding Techniques for Image Segmentation”, IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, Proceedings of the SPIE Vol. 5132, May 2003.

Price, J.R., Bingham, P.R., Tobin, K.W., and Karnowski, T.P., “Semiconductor Sidewall Shape Estimation using Top-down CD-SEM Image Retrieval”, IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, Proceedings of the SPIE Vol. 5132, May 2003.

Price, J.R., Hylton, K.W., Tobin, K.W., Bingham, P.R., Hunn, J.D., and Haines, J.R., “Detection of Cavitation Pits on Steel Surfaces using SEM Imagery”, IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, Proceedings of the SPIE Vol. 5132, May 2003.

Bourgeat, P., Meriaudeau, F., Tobin, K.W., Gorria, P., “Patterned Wafer Segmentation”, IEEE/SME/SPIE 6th International Conference on Quality Control by Artificial Vision, Proceedings of the SPIE Vol. 5132, May 2003.

Bingham, P.R., Price, J.R., Tobin, K.W., Bennett, M., Bogardus, H., “Sidewall Structure Estimation from CD-SEM for Lithographic Process Control”, Process and Materials Characterization and Diagnostics in IC Manufacturing II, Proceedings of the SPIE Vol. 5041, May 2003.

Price, J.R., Bingham, P.R., Tobin, K.W., Karnowski, T.P., “Estimating Cross-section Semiconductor Structure by Comparing Top-down SEM Images”, Machine Vision Applications in Industrial Inspection XI, Proc. SPIE, Vol. 5011, March 2003.

Bourgeat, P., Meriaudeau, F. Gorria, P., Tobin, K.W., “Content-based Segmentation of Patterned Wafers for Automatic Threshold Determination”, Machine Vision Applications of Industrial Inspection XI, Proceedings of the SPIE Vol. 5011, March 2003.

Tobin, K.W., Lakhani, F., Karnowski, T.P., "An Industry Survey of Automatic Defect Classification Technologies, Methods, and Performance", Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE Vol. 4692, March 2002.

Karnowski, T.P., Tobin, K.W., Ferrell, R.K., Lakhani, F., "Using an Image Retrieval System for Image Data Management", Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE Vol. 4692, March 2002.

Gleason, S.S., Ferrell, R.K., Karnowski, T.P., Tobin, K.W., "Detection of Semiconductor Defects Using A Novel Fractal Encoding Algorithm", Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE Vol. 4692, March 2002.

Thomas, C.E., Bahm, T., Baylor, L. R., Bingham, P., Burns, S., Chidley, M., Dai, L., Delahanty, B., Doti,, C., El-Khashab, A., Fisher, R., Gilbert, J., Goddard, J.S., Hanson, G., Hickson, J., Hunt, M.A., Hylton, K.W., John, G., Jones, M., Macdonald, K., Mayo, M., McMackin, I., Patek, D., Price, J., Rasmussen, D., Schaefer, L., Scheidt, T., Schulze, M., Schumaker, P., Shen, B., Smith, R., Su, A., Tobin, K.W., Voelkl, E., Weber, K., “Direct to Digital Holography for Semiconductor Wafer Defect Detection and Review”, Design, Process Integration, and Diagnostics in IC Manufacturing, Proceedings of the SPIE Vol. 4692, March 2002.

Price, J.R., Gee, T.F., Tobin, K.W., “Blur Estimation in Limited-control Environments”, IEEE International Conference on Acoustics, Speech, and Signal Processing, Salt Lake City Utah, May 7-11, 2001.

Tobin, K.W., Karnowski, T.P., Arrowood, L.F., and Lakhani, F., “Field Test Results of an Automated Image Retrieval System”, 12th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Munich, Germany, April 23-24, 2001.

Tobin, K.W., Karnowski, T.P., Lakhani, F., “Integrated Applications of Inspection Data in the Semiconductor Manufacturing Environment”, Metrology-based Control for Micro-manufacturing, Proceedings of the SPIE Vol. 4275, 2001, pp. 31-40.

Karnowski, T.P., Tobin, K.W., Arrowood, L.F., Goddard, J.S., Ferrell, R.K., and Lakhani, F. “Field Test Results of an Image Retrieval System for Semiconductor Yield Learning”, Metrology-based Control for Micro-manufacturing, Proceedings of the SPIE Vol. 4275, 2001, pp. 41-52.

Tobin, K.W., Karnowski, T.P., Lakhani, F., “The Use of Historical Defect Imagery for Yield Learning”, The 11th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Fairmont Copley Plaza Hotel, Boston, MA, September 12-14, 2000.

Tobin, K.W., Karnowski, T.P., Lakhani, F., “A Survey of Semiconductor Data Management Systems Technology”, Metrology, Inspection, and Process Control for Microlithogrpahy, Proc. SPIE, Vol. 3998, pp. 248-257, June 2000.

Karnowski, T.P., Tobin, K.W., Ferrell, R.K., and Lakhani, F., “Content Based Image Retrieval for Semiconductor Manufacturing”, Machine Vision Applications in Industrial Inspection, Proc. SPIE, Vol. 3966, 2000, pp. 162-172, March 2000.

Tobin, K.W., Hunt, M.A., Goddard, J.S., Hylton, K.W., Treece, D.A., Richards, R.K., and Simpson, M.L., “Accommodating Multiple Illumination Sources in an Imaging Colorimetry Environment”, Machine Vision Applications in Industrial Inspection, Proc. SPIE, Vo. 3966, 2000, pp. 194-205.

Gee, T.F., Karnowski, T.P., Tobin, K.W., “Multiframe Combination and Blur Deconvolution of Video Data”, IS&T/SPIE’s 12th International Symposium on Electronic Imaging: Science and Technology, San Jose Convention Center, January 2000.

Patents

Tobin, K.W., Karnowski, T.P., Chaum, E., “Method and System for the Diagnosis of Disease Using Retinal Image Content and an Archive of Diagnosed Human Patient Data,” UT-Battelle, LLC, Invention Disclosure No. 1596.1, U.S. Patent No. 8,503,749, August 6, 2013.

Tobin, K.W., Bingham, P.R., Hawari, A., “Apparatus and Method to Achieve High-Resolution Microscopy with Non-Diffracting or Refracting Radiation,” UT-Battelle, LLC, Invention Disclosure No. 1300002076, U.S. Patent No. 8,304,737, November 6, 2012.

Tobin, K.W., Karnowski, T.P., Chaum, E., “A Method for the Diagnosis of Blinding Eye Disease using Image Content and an Archive of Diagnosed Human Patient Data,” UT-Battelle, LLC, Invention Disclosure No. 1596, DOE No. S-105,198, U.S. Patent No. 8,243,999, August 14, 2012.

Karnowski, T.P., Tobin, K.W., Govindasamy, P., “Method for Confidence Metric in Optic Disk Location in Retinal Images,” UT-Battelle, LLC, Invention Disclosure No. 2031, U.S. Patent No. 8,218,838, July 10, 2012.

Tobin, K.W., Karnowski, T.P., “Method for the Reduction of Image Content Redundancy in Large Image Databases”, UT-Battelle, LLC, Invention Disclosure No. 1485, US DOE S-105,086, U.S. Patent No. 7,672,976, March 2, 2010.

Hanson, G.R., Bingham, P.R., Tobin, K.W., “Spatial-Heterodyne Interferometry for Reflection and Transmission (SHIRT) Measurements,” UT-Battelle, LLC, Invention Disclosure No. 1225, DOE S-101,813, U.S. Patent No. 6,999,178 B2, February 14, 2006.

Bingham, P.R., Hanson, G.R., Tobin, K.W., “Spatial-heterodyne interferometry for transmission (SHIFT) measurements”, UT-Battelle, LLC, Invention Disclosure No. 1224, DOE S-101,812, U.S. Patent No. 7,119,905, October 10, 2006.

Tobin, K.W., Karnowski, T.P., Ferrell, R.K., “Method for Indexing and Retrieving Manufacturing-Specific Digital Imagery Based on Image Content”, ERID No. 0668 / Q&B 6321-131, U.S. Patent No. 6,751,343, June 15, 2004.

Tobin, K.W., Karnowski, T.P., Ferrell, R.K., “Method for Localizing and Isolating an Errant Process Step”, U.S. Patent No. 6,535,776, March 18, 2003.

Paulus, M.J., Sari-Sarraf, H., Tobin, K.W., Gleason, S.S., Thomas, C.E., “Ultra-High Resolution Computed Tomography Imaging”, U.S. Patent No. 6,421,409, July 16, 2002.

Tobin, K.W., Thomas, C.E., "X-ray Confocal Coded Aperture Imaging System”, U.S. Patent No. 6,195,412, February 27, 2001.

Tobin, K.W., Jr., Gleason, S.S., Karnowski, T.P., and Sari-Sarraf H., “Automated Defect Signature Analysis for Semiconductor Manufacturing Process Improvement”, U.S. Patent No. 5,982,920, January 7, 1997.

Dooley, J.B., Muhs, J.D., Tobin, K.W., “Fiber Optic Vibration Sensor”, U.S. Patent No. 5,381,492, January 10, 1995,

Muhs, J.D., Jordan, J.K., Tobin, K.W., LaForge, J.V., “Apparatus for Weighing and Identifying Characteristics of a Moving Vehicle”, U.S. Patent No. 5,260,520, November 9, 1993.

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